Stella original measuring system (ST/LST series) by the CAD data match-up method
AOI can be treated for mere 10 seconds in this system
Work specification
Measuremnet area
420 × 320 mm
Maximum board size
550 × 470 mm
Repeat accuracy
± 1 pixel and under
Measuremnet accuracy
± 1 pixel and under
Driving method
Air actuator
Camera and lens specification
Camera
50 Mega-pixel Camera (8688 × 5792）
Lens
Fixed lens
Viewing field
Pixel 25 μm mode:434 × 289 mm
Pixel 20μm mode:347 × 230 mm
Illuminator
Coaxial light, Edge light
Software specification
Minimum image unit
1μm (Inicial）
Measuring function
Distance
Teaching function
〇 (off-line）
Reading data format
Gerber (274D, 274X), DXF, DWG, NC, and so on.
Output method of result
CSV format text file
Machine specification
Size (WxDxH)
840 (W) × 1302 (D) ×1892 mm (H)
Weight
330 kg
Power supply
AC 100V
PC specification
OS
Windows10 Professional 64bi
CPU
Intel or AMD
Memory
32GB and over
HDD
1TB and over
Stella Corporation has developed a high speed AOI system "One Shot
Inspection", and shipped the first machine.
In this system, first of all, various patterns in the substrate is captured at 1 shot by the CCD area sensor camera (50 mega-pixel), and then, AOI is treated by original image treatment technologies. AOI time of 320 × 420 ㎜ substrate is mere 10 seconds.
Typical detect resolution is 20 μm. It's possible to treat not only AOI but also automatic measuring by option. Furthermore, glass, metal plate, and ceramics plate can be adopted as a substrate.
