Problem and its solution by our software |
Process flow sample of multi layered PCB |
Problem and its solution by our hardware |
It's difficult to read data.
Also, it's impossible to read a data which is based on Gerber format.
The software supports DXF format and ODB ＋ data.
CAD/CAM system“Fine Vision for JAVA” |
①CAD design |
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It's necessary to commonalize data standard.
End results change because of ununiformed ability of operators.
It's necessary to automatize or semi-automatize work.
CAD/CAM system“Fine Vision for JAVA”
Yield is low.
Distance Offset function |
②CAM Edit |
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③Draw up film mask |
Manufacture PCB by use of supplied film mask.
Price of supplied film mask is expensive.
It's difficult to shorten delivery time because of outsourcing.
Laser plotter“SilverWriter” |
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④Expose inside layer |
It's desirable to find out defect after exposure.
Position of NC and film is stirred.
Measuring ＆ AOI inspection system “ST series” |
Etching result occurs non-uniformly.
Open and short defects occur often.
Distance Offset function |
⑤Etching of inside layer |
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⑥Inspection of inside layer(AOI) |
Interlevel inspection of inside layer
It's desirable for over demand or oversupply to occur in the final inspection.
Inspection by the data comparison method
Measuring ＆ AOI inspection system “ST series” |
Board makes an expansion and contraction
Draw up plotting data correspond to expansion and contraction of board
CAD/CAM system“Fine Vision for JAVA”
Measuring ＆ AOI inspection system “ST series” |
⑦Press of stacked layers |
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NC data
Prepare effective data
CAD/CAM system“Router Vision for JAVA” |
⑧Open up NC hole |
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⑨Plate with Cu |
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⑩Expose outside layer |
It's desirable to find out defect after exposure.
Position of NC and the film is stirred.
Measuring ＆ AOI inspection system “ST series” |
Etching result occurs non-uniformly.
Open and short defects occur often.
Distance Offset function |
⑪Eth outside layer |
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⑫Inspection of outside layer(AOI) |
Interlevel inspection of outside layer
It's desirable for over demand or oversupply to occur in the final inspection.
Inspection by the data comparison method
Measuring ＆ AOI inspection system “ST series” |
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⑬Print resist |
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⑭Print by screen printing method |
Process management, enhancement of yield
Quality guarantee, analyzation of defect
It's desirable to compass process accuracy in the all processes and analyze source of trouble.
Prepare data from the film
It's desirable to prepare Gerber data from the film.
It's desirable to calibrate data.
It's desirable to feed back variability, expansion and contraction, strain, measurement result and enhance yield.
Measuring ＆ AOI inspection system “ST series” |
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⑮Plate solder |
Reduce process steps and enhancement of quality
It's desirable prepare data of router processing machine from Gerber data automatically or semi-automatically.
CAD/CAM system“Router Vision for JAVA” |
⑯Fabricate outer shape |
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⑰Electrical inspection |
Delivery amount is insufficient because quality depends on the final inspection.Cost of manufacture becomes to be more expensive by oversupply because of low yield.
CAD/CAM system“Fine Vision for JAVA” |
⑱Final inspection |
